The first probe is capable of making transmission and reflection measurements on linear electrical networks. Also still with the same probe, we can evaluate and study the “S” parameters, that is, the electrical behavior of linear electrical networks subjected to stimulation by steady-state electrical signals. Probe No. 2, has the ability to measure a number of particular parameters, directly on passive electronic components, such as capacitors, resistors, inductances, etc. Specifically, the parameters |Z|, |Y|, |R|, |X|, |G|, |B|, |C|, |D|, etc., on 50ohm load.

We are able to select and parameterize power transistors, such as MOSFETs, BJTs, JFETs, FETs, SCRs, TRIACs, DIODES, etc., with traciacurve tool, making a selection with extremely low relative error, close to zero.

We provide information, evaluating and studying 220Vac signal, power and network cables, highlighting possible parasitic capacitance, dB loss, reflection coefficient, parasitic inductances, etc. We evaluate cooling systems, for large power dissipation, such as MOSFETs, TRANSISTORs, IGBTs, etc. We provide information on the type of dissipation and the type of heatsink to be used.

Instrumentation for electronic analysis is important with new technology developing around human beings extremely fast. We use logic analyzers to visualize the signals of a digital circuit in order to capture time diagrams, decode communication protocols, etc. Up to 48 channels, with acquisition signals at 100MHz asynchronous and 25 MHz synchronous, electrical insulation measurements, resistive etc., on industrial machines, electrical/electronic equipment.

This and much more, is possible with our instrumentation. Please contact us for any information, quotes and/or concerns.